Author: David L. Elwood

Publications

Publications

Elwood, David L. (1972): Test Retest Reliability and Cost Analyses of Automated and Face to Face Intelligence Testi. In International Journal of Man-Machine Studies, 4 (1) pp. 1-22.

Elwood, David L. (1972): Automated WAIS Testing Correlated with Face-to-Face WAIS Testing: A Validity Study. In International Journal of Man-Machine Studies, 4 (2) pp. 129-137.

Elwood, David L. (1972): Automated versus Face-to-Face Intelligence Testing: Comparison of Test-Retest Reliabilitie. In International Journal of Man-Machine Studies, 4 (3) pp. 363-369.