Author: John Lynch
Publications
Publication period start: 2000
Number of co-authors: 3
Co-authors
Number of
publications with favourite co-authors
Productive Colleagues
Most productive
colleagues in number of publications
Publications
Agarwal, Ritu, Prasad, Jayesh, Tanniru, Mohan, Lynch, John (2000): Risks of rapid application development. In Communications of the ACM, 43 (11) pp. 1. https://dl.acm.org/doi/10.1145/352515.352516