Author: John P. Hayes
Publications
Publication period start: 1996
Number of co-authors: 2
Co-authors
Number of
publications with favourite co-authors
Productive Colleagues
Most productive
colleagues in number of publications
Publications
Murray, Brian T., Hayes, John P. (1996): Testing ICs: Getting to the Core of the Problem. In IEEE Computer, 29 (11) pp. 32-38.
Bhattacharya, Debashis, Murray, Brian T., Hayes, John P. (1989): High-Level Test Generation for VLSI. In IEEE Computer, 22 (4) pp. 16-24.