Author: Vijayram Gopu
Publications
Publication period start: 2004
Number of co-authors: 2
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publications with favourite co-authors
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Publications
Schroeder, Patrick J., Bolaki, Pankaj, Gopu, Vijayram (2004): Comparing the Fault Detection Effectiveness of N-way and Random Test Suites. In: ISESE 2004 - International Symposium on Empirical Software Engineering 19-20 August, 2004, Redondo Beach, CA, USA. pp. 49-59. https://doi.ieeecomputersociety.org/10.1109/ISESE.2004.16