Author: Yervant Zorian

Publications

Co-authors

Don Edenfeld

2

Andrew B. Kahng

2

Mike Rodgers

2

Productive Colleagues

William H. Joyner Jr.

2

Andrew B. Kahng

2

Mike Rodgers

2

Publications

Zorian, Yervant (2005): Nanoscale Design & Test Challenges. In IEEE Computer, 38 (2) pp. 36-39. https://doi.ieeecomputersociety.org/10.1109/MC.2005.67

Edenfeld, Don, Kahng, Andrew B., Rodgers, Mike, Zorian, Yervant (2004): 2003 Technology Roadmap for Semiconductors. In IEEE Computer, 37 (1) pp. 47-56. https://csdl.computer.org/comp/mags/co/2004/01/r1047abs.htm

Allan, Alan, Edenfeld, Don, Jr., William H. Joyner, Kahng, Andrew B., Rodgers, Mike, Zorian, Yervant (2002): 2001 Technology Roadmap for Semiconductors. In IEEE Computer, 35 (1) pp. 42-53. https://csdl.computer.org/computer/co2002/r1042abs.htm

Zorian, Yervant, Marinissen, Erik Jan, Dey, Sujit (1999): Testing Embedded-Core-Based System Chips. In IEEE Computer, 32 (6) pp. 52-60.